Near-Field Characterization of Micro /Nano-Scaled Fluid Flows (Registro nro. 14265)
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| 000 -CABECERA | |
|---|---|
| Campo de control de longitud fija | 04204nam a2200265za04500 |
| 001 - NÚMERO DE CONTROL | |
| Campo de control | 17640 |
| 008 - CAMPO FIJO DE DESCRIPCIÓN FIJA--INFORMACIÓN GENERAL | |
| Campo de control de longitud fija | 050703s2011 gw eng d |
| 020 ## - ISBN (INTERNATIONAL STANDARD BOOK NUMBER) | |
| ISBN | 9783642204265 99783642204265 |
| 082 ## - NÚMERO DE LA CLASIFICACIÓN DECIMAL DEWEY | |
| Número de clasificación Decimal | 620.1064 |
| Número de documento (Cutter) | 223 |
| 100 ## - ENCABEZAMIENTO PRINCIPAL--NOMBRE PERSONAL | |
| Nombre de persona | Kihm, Kenneth D. |
| Término relacionador | author. |
| 9 (RLIN) | 35414 |
| 245 ## - TÍTULO PROPIAMENTE DICHO | |
| Título | Near-Field Characterization of Micro /Nano-Scaled Fluid Flows |
| Medio físico | [electronic resource] / |
| Mención de responsabilidad, etc. | by Kenneth D. Kihm. |
| 300 ## - DESCRIPCIÓN FÍSICA | |
| Extensión | VIII, 156 p. |
| Otros detalles físicos | online resource. |
| 490 ## - MENCIÓN DE SERIE | |
| Mención de serie | Experimental Fluid Mechanics; |
| 490 ## - MENCIÓN DE SERIE | |
| Número de volumen/designación secuencial | -0 |
| 505 ## - NOTA DE CONTENIDO FORMATEADA | |
| Nota de contenido con formato preestablecido | Introduction -- Definitions of near-field -- Evanescent wave penetration depth -- Surface -- Photon penetration skin-depth into metal -- Penetration depth of no-slip boundary conditions -- Equilibrium height (hm) for small particles under near-field forces -- Total Internal Reflection Microscopy (TIRM) -- Ratiometric TIRM imaging analysis -- Near-field applications of TIRM -- Near-wall hindered Brownian motion of nanoparticles -- Slip-flows in the near-field -- Cytoplasmic viscosity and intracellular vesicle sizes -- Optical Serial Sectioning Microscopy (OSSM) -- Point spread functions (PSFs) under aberration-free design conditions -- Point spread functions (PSFs) under off-design conditions -- Principles of OSSM -- Near-field applications of OSSM -- Three-dimensional particle tracking velocimetry (PTV) -- Near-wall thermometry -- Near-field mixture concentration measurements -- Confocal Laser Scanning Microscopy (CLSM) -- Principles of confocal imaging -- Microscopic imaging resolutions -- Confocal microscopic imaging resolutions -- Optical slicing thickness of confocal microscopy -- Confocal laser scanning microscopic particle imaging velocimetry (CLSM-PIV) system -- Near-field applications of CLSM-PIV -- Poiseuille flows in a microtube -- Microscale rotating Couette flows -- Moving bubbles in a microchannel -- Surface Plasmon Resonance Microscopy (SPRM) -- Surface plasmon polaritons (SPPs) -- Dispersion of SPP -- Kretschmann's three-layer configuration -- Surface plasmon resonance (SPR) reflectance -- Surface plasmon resonance microscopy (SPRM) imaging systems -- Selection of a prism for SPRM -- SPR reflectance imaging resolution -- Near-field applications of SPRM -- History and uses of SPRM -- Label-free mapping of microfluidic mixing fields -- Near-field mapping of salinity diffusion -- Dynamic monitoring of nanoparticle concentration profiles -- Unveiling the fingerprints of nanocrystalline self-assembly -- Near-wall thermometry -- Reflection Interference Contrast Microscopy (RICM) -- Interference of plane waves -- Principles and practical issues of RICM -- Near-field applications of RICM -- Thin-film thickness measurements -- Electrohydrodynamic (EHD) control of thin liquid film -- Dynamic fingerprinting of live-cell focal contacts -- References. |
| 520 ## - RESUMEN, ETC. | |
| Nota de sumario, etc. | The near-field the region within 100 nm from a solid interface - is an exciting arena in which several important multi-scale transport phenomena are physically characterized, such as flow mixing and drag, heat and mass transfer, near-wall behavior of nanoparticles, the binding of bio-molecules, crystallization, and surface deposition processes, just to name a few. This book presents a number of microscopicimaging techniques that were implemented and tested for near-field fluidic characterizations. These methods include Total Internal Reflection Microscopy (TIRM), Optical Serial Sectioning Microscopy (OSSM), Confocal Laser Scanning Microscopy (CLSM), Surface Plasmon Resonance Microscopy (SPRM), and Reflection Interference Contrast Microscopy (RICM). The basic principles, specifics of implementation, and example applications of each method are presented in order to promote the reader's understanding of the techniques, so that these may be applied to their own research interests. |
| 650 ## - ASIENTO SECUNDARIO DE MATERIA--TÉRMINO DE MATERIA | |
| Nombre de materia o nombre geográfico como elemento de entrada | Engineering. |
| 9 (RLIN) | 96 |
| 650 ## - ASIENTO SECUNDARIO DE MATERIA--TÉRMINO DE MATERIA | |
| Nombre de materia o nombre geográfico como elemento de entrada | Engineering. |
| 9 (RLIN) | 96 |
| 650 ## - ASIENTO SECUNDARIO DE MATERIA--TÉRMINO DE MATERIA | |
| 9 (RLIN) | 34088 |
| Nombre de materia o nombre geográfico como elemento de entrada | HYDRAULIC ENGINEERING |
| 650 ## - ASIENTO SECUNDARIO DE MATERIA--TÉRMINO DE MATERIA | |
| 9 (RLIN) | 33943 |
| Nombre de materia o nombre geográfico como elemento de entrada | ENGINEERING FLUID DYNAMICS |
| 650 ## - ASIENTO SECUNDARIO DE MATERIA--TÉRMINO DE MATERIA | |
| 9 (RLIN) | 33706 |
| Nombre de materia o nombre geográfico como elemento de entrada | FLUID, AND AERODYNAMICS |
| 710 ## - ENCABEZAMIENTO SECUNDARIO--NOMBRE CORPORATIVO | |
| Nombre corporativo o de jurisdicción como elemento de entrada | SpringerLink (Online service) |
| 9 (RLIN) | 111 |
| 856 ## - ACCESO ELECTRÓNICO | |
| Identificador uniforme del recurso URI | <a href="http://springer.escuelaing.metaproxy.org/book/10.1007/978-3-642-20426-5">http://springer.escuelaing.metaproxy.org/book/10.1007/978-3-642-20426-5</a> |
| Texto del enlace | ir a documento |
| Tipo de formato electrónico | URL |
| 942 ## - ELEMENTOS KOHA | |
| Fuente de clasificación o esquema de ordenación en estanterías | |
| Koha tipo de item | DOCUMENTOS DIGITALES |
| Disponibilidad | Mostrar en OPAC | Fuente de clasificación o esquema | Tipo de Descarte | Restricciones de uso | Estado | Código de colección | Localización permanente | Localización actual | Fecha adquisición | Proveedor | Forma de Adq | Precio normal de compra | Datos del ítem (Volumen, Tomo) | Préstamos totales | Signatura completa | Código de barras | Fecha última consulta | Número de ejemplar | Propiedades de Préstamo KOHA | Programa Académico |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Préstamo Normal | Digital | Biblioteca Jorge Álvarez Lleras | Biblioteca Jorge Álvarez Lleras | 2014-04-08 | Springer-444444025-OS1549 | Compra | 13770.00 | Ej. 1 | 620.1064 223 | D000576 | 2014-10-14 | 1 | DOCUMENTOS DIGITALES | Biblioteca |
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