Predictive Technology Model for Robust Nanoelectronic Design [electronic resource] / by Yu Cao.

Por: Cao, Yu [author.]Colaborador(es): SpringerLink (Online service)Tipo de material: TextoTextoSeries Integrated Circuits and Systems; Descripción: XV, 173p. 128 illus. online resourceISBN: 9781461404453 99781461404453Tema(s): Engineering | Engineering | OPERATING SYSTEMS (COMPUTERS) | NANOTECHNOLOGY | NANOTECHNOLOGY | ELECTRONICS AND MICROELECTRONICS, INDTRUMENTATION | PERFORMANCE AND RELIABILITY | CIRCUITS AND SYSTEMS | ELECTRONICS | SYSTEMS ENGINEERINGClasificación CDD: 621.3815 Recursos en línea: ir a documento
Contenidos:
1. Introduction -- 2. Predictive Technology Model of Conventional CMOS Devices -- 3. Predictive Technology Model of Enhanced CMOS Devices -- 4. Statistical Extraction and Modeling of CMOS Variability -- 5. Modeling of Temporal Reliability Degradation -- 6. Modeling of Interconnect Parasitics -- 7. Design Benchmark with Predictive Technology Model -- 8. Predictive Process Design Kits -- 9. Predictive Modeling of Carbon Nanotube Devices -- 10. Predictive Technology Model for Future Nanoelectronic Design.
Resumen: Predictive Technology Model for Robust Nanoelectronic Design explains many of the technical mysteries behind the Predictive Technology Model (PTM) that has been adopted worldwide in explorative design research. Through physical derivation and technology extrapolation, PTM is the de-factor device model used in electronic design. This work explains the systematic model development and provides a guide to robust design practice in the presence of variability and reliability issues. Having interacted with multiple leading semiconductor companies and university research teams, the author brings a state-of-the-art perspective on technology scaling to this work and shares insights gained in the practices of device modeling.
Etiquetas de esta biblioteca: No hay etiquetas de esta biblioteca para este título. Ingresar para agregar etiquetas.
    Valoración media: 0.0 (0 votos)
Tipo de ítem Ubicación actual Colección Signatura Info Vol Copia número Estado Fecha de vencimiento Código de barras Reserva de ítems
DOCUMENTOS DIGITALES DOCUMENTOS DIGITALES Biblioteca Jorge Álvarez Lleras
Digital 621.3815 223 (Navegar estantería) Ej. 1 1 Disponible D000628
Total de reservas: 0

1. Introduction -- 2. Predictive Technology Model of Conventional CMOS Devices -- 3. Predictive Technology Model of Enhanced CMOS Devices -- 4. Statistical Extraction and Modeling of CMOS Variability -- 5. Modeling of Temporal Reliability Degradation -- 6. Modeling of Interconnect Parasitics -- 7. Design Benchmark with Predictive Technology Model -- 8. Predictive Process Design Kits -- 9. Predictive Modeling of Carbon Nanotube Devices -- 10. Predictive Technology Model for Future Nanoelectronic Design.

Predictive Technology Model for Robust Nanoelectronic Design explains many of the technical mysteries behind the Predictive Technology Model (PTM) that has been adopted worldwide in explorative design research. Through physical derivation and technology extrapolation, PTM is the de-factor device model used in electronic design. This work explains the systematic model development and provides a guide to robust design practice in the presence of variability and reliability issues. Having interacted with multiple leading semiconductor companies and university research teams, the author brings a state-of-the-art perspective on technology scaling to this work and shares insights gained in the practices of device modeling.

No hay comentarios en este titulo.

para colocar un comentario.