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Predictive Technology Model for Robust Nanoelectronic Design [electronic resource] / by Yu Cao.

By: Cao, Yu [author.]
Contributor(s): SpringerLink (Online service)
Material type: TextTextSeries: Integrated Circuits and Systems; Description: XV, 173p. 128 illus. online resourceISBN: 9781461404453 99781461404453Subject(s): Engineering | Engineering | OPERATING SYSTEMS (COMPUTERS) | NANOTECHNOLOGY | NANOTECHNOLOGY | ELECTRONICS AND MICROELECTRONICS, INDTRUMENTATION | PERFORMANCE AND RELIABILITY | CIRCUITS AND SYSTEMS | ELECTRONICS | SYSTEMS ENGINEERINGDDC classification: 621.3815 Online resources: ir a documento
Contents:
1. Introduction -- 2. Predictive Technology Model of Conventional CMOS Devices -- 3. Predictive Technology Model of Enhanced CMOS Devices -- 4. Statistical Extraction and Modeling of CMOS Variability -- 5. Modeling of Temporal Reliability Degradation -- 6. Modeling of Interconnect Parasitics -- 7. Design Benchmark with Predictive Technology Model -- 8. Predictive Process Design Kits -- 9. Predictive Modeling of Carbon Nanotube Devices -- 10. Predictive Technology Model for Future Nanoelectronic Design.
Summary: Predictive Technology Model for Robust Nanoelectronic Design explains many of the technical mysteries behind the Predictive Technology Model (PTM) that has been adopted worldwide in explorative design research. Through physical derivation and technology extrapolation, PTM is the de-factor device model used in electronic design. This work explains the systematic model development and provides a guide to robust design practice in the presence of variability and reliability issues. Having interacted with multiple leading semiconductor companies and university research teams, the author brings a state-of-the-art perspective on technology scaling to this work and shares insights gained in the practices of device modeling.
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Item type Current location Collection Call number Vol info Copy number Status Date due Barcode Item holds
DOCUMENTOS DIGITALES DOCUMENTOS DIGITALES Biblioteca Jorge Álvarez Lleras
Digital 621.3815 223 (Browse shelf) Ej. 1 1 Available D000628
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1. Introduction -- 2. Predictive Technology Model of Conventional CMOS Devices -- 3. Predictive Technology Model of Enhanced CMOS Devices -- 4. Statistical Extraction and Modeling of CMOS Variability -- 5. Modeling of Temporal Reliability Degradation -- 6. Modeling of Interconnect Parasitics -- 7. Design Benchmark with Predictive Technology Model -- 8. Predictive Process Design Kits -- 9. Predictive Modeling of Carbon Nanotube Devices -- 10. Predictive Technology Model for Future Nanoelectronic Design.

Predictive Technology Model for Robust Nanoelectronic Design explains many of the technical mysteries behind the Predictive Technology Model (PTM) that has been adopted worldwide in explorative design research. Through physical derivation and technology extrapolation, PTM is the de-factor device model used in electronic design. This work explains the systematic model development and provides a guide to robust design practice in the presence of variability and reliability issues. Having interacted with multiple leading semiconductor companies and university research teams, the author brings a state-of-the-art perspective on technology scaling to this work and shares insights gained in the practices of device modeling.

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