Nanotribology and Nanomechanics I [electronic resource]: Measurement Techniques and Nanomechanics / edited by Bharat Bhushan.
Colaborador(es): Bhushan, Bharat
| [editor.] | SpringerLink (Online service)Tipo de material: 
TextoDescripción: XVIII, 623p. 341 illus. online resourceISBN: 9783642152832 99783642152832Tema(s): Engineering | Engineering | NANOSCALE SCIENCE AND TECHNOLOGY | NANOTECHNOLOGY AND MICROENGINEERING | NANOTECHNOLOGY | NANOTECHNOLOGYClasificación CDD: 620.5 Recursos en línea: ir a documento
Contenidos:
Resumen: The comprehensive reference and textbook serves as a timely, practical introduction to the principles of nanotribology and nanomechanics. Assuming some familiarity with macroscopic tribology, the book comprises chapters by internationally recognized experts, who integrate knowledge of the field from the mechanics and materials-science perspectives. They cover key measurement techniques, their applications, and theoretical modelling of interfaces, each beginning their contributions with macro- and progressing to microconcepts.
Introduction - Measurement Techniques and Applications -- Scanning Probe Microscopy - Principle of Operation, Instrumentation and Probes -- General and Special Probes in Scanning Microscopies -- Force Calibration Techniques for AFM Cantilevers -- Noncontact Atomic Force Microscopy and Related Topics -- Low Temperature Scanning Probe Microscopy -- Dynamic Modes of Atomic Force Microscopy -- Molecular Single Molecular Recognition Force Spectroscopy and Imaging -- Nanomechanical Properties of Solid Surfaces and Thin Films -- Computer Simulations of Nanometer-Scale Indentation and Friction.
| Tipo de ítem | Ubicación actual | Colección | Signatura | Info Vol | Copia número | Estado | Fecha de vencimiento | Código de barras | Reserva de ítems |
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Biblioteca Jorge Álvarez Lleras | Digital | 620.5 223 (Navegar estantería) | Ej. 1 | 1 | Disponible | D000573 |
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Introduction - Measurement Techniques and Applications -- Scanning Probe Microscopy - Principle of Operation, Instrumentation and Probes -- General and Special Probes in Scanning Microscopies -- Force Calibration Techniques for AFM Cantilevers -- Noncontact Atomic Force Microscopy and Related Topics -- Low Temperature Scanning Probe Microscopy -- Dynamic Modes of Atomic Force Microscopy -- Molecular Single Molecular Recognition Force Spectroscopy and Imaging -- Nanomechanical Properties of Solid Surfaces and Thin Films -- Computer Simulations of Nanometer-Scale Indentation and Friction.
The comprehensive reference and textbook serves as a timely, practical introduction to the principles of nanotribology and nanomechanics. Assuming some familiarity with macroscopic tribology, the book comprises chapters by internationally recognized experts, who integrate knowledge of the field from the mechanics and materials-science perspectives. They cover key measurement techniques, their applications, and theoretical modelling of interfaces, each beginning their contributions with macro- and progressing to microconcepts.
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