000 02392nam a2200325za04500
001 17382
008 050703s2011 xxu eng d
020 _a9781461404453 99781461404453
082 _a621.3815
_b223
100 _aCao, Yu.
_eauthor.
_935606
245 _aPredictive Technology Model for Robust Nanoelectronic Design
_h[electronic resource] /
_cby Yu Cao.
300 _aXV, 173p. 128 illus.
_bonline resource.
490 _aIntegrated Circuits and Systems
490 _x-1558-9412
505 _a1. Introduction -- 2. Predictive Technology Model of Conventional CMOS Devices -- 3. Predictive Technology Model of Enhanced CMOS Devices -- 4. Statistical Extraction and Modeling of CMOS Variability -- 5. Modeling of Temporal Reliability Degradation -- 6. Modeling of Interconnect Parasitics -- 7. Design Benchmark with Predictive Technology Model -- 8. Predictive Process Design Kits -- 9. Predictive Modeling of Carbon Nanotube Devices -- 10. Predictive Technology Model for Future Nanoelectronic Design.
520 _aPredictive Technology Model for Robust Nanoelectronic Design explains many of the technical mysteries behind the Predictive Technology Model (PTM) that has been adopted worldwide in explorative design research. Through physical derivation and technology extrapolation, PTM is the de-factor device model used in electronic design. This work explains the systematic model development and provides a guide to robust design practice in the presence of variability and reliability issues. Having interacted with multiple leading semiconductor companies and university research teams, the author brings a state-of-the-art perspective on technology scaling to this work and shares insights gained in the practices of device modeling.
650 _aEngineering.
_996
650 _aEngineering.
_996
650 _933866
_aOPERATING SYSTEMS (COMPUTERS)
650 _933748
_aNANOTECHNOLOGY
650 _933748
_aNANOTECHNOLOGY
650 _933664
_aELECTRONICS AND MICROELECTRONICS, INDTRUMENTATION
650 _933662
_aPERFORMANCE AND RELIABILITY
650 _933660
_aCIRCUITS AND SYSTEMS.
650 _933659
_aELECTRONICS
650 _933673
_aSYSTEMS ENGINEERING
710 _aSpringerLink (Online service)
_9111
856 _uhttp://springer.escuelaing.metaproxy.org/book/10.1007/978-1-4614-0445-3
_yir a documento
_qURL
942 _2ddc
_cCF
999 _c14007
_d14007