000			04204nam a2200265za04500
001			17640
008			050703s2011 gw eng d
020			_a9783642204265 99783642204265
082			_a620.1064 _b223
100			_aKihm, Kenneth D. _eauthor. _935414
245			_aNear-Field Characterization of Micro /Nano-Scaled Fluid Flows _h[electronic resource] / _cby Kenneth D. Kihm.
300			_aVIII, 156 p. _bonline resource.
490			_aExperimental Fluid Mechanics;
490			_v-0
505			_aIntroduction -- Definitions of near-field -- Evanescent wave penetration depth -- Surface -- Photon penetration skin-depth into metal -- Penetration depth of no-slip boundary conditions -- Equilibrium height (hm) for small particles under near-field forces -- Total Internal Reflection Microscopy (TIRM) -- Ratiometric TIRM imaging analysis -- Near-field applications of TIRM -- Near-wall hindered Brownian motion of nanoparticles -- Slip-flows in the near-field -- Cytoplasmic viscosity and intracellular vesicle sizes -- Optical Serial Sectioning Microscopy (OSSM) -- Point spread functions (PSFs) under aberration-free design conditions -- Point spread functions (PSFs) under off-design conditions -- Principles of OSSM -- Near-field applications of OSSM -- Three-dimensional particle tracking velocimetry (PTV) -- Near-wall thermometry -- Near-field mixture concentration measurements -- Confocal Laser Scanning Microscopy (CLSM) -- Principles of confocal imaging -- Microscopic imaging resolutions -- Confocal microscopic imaging resolutions -- Optical slicing thickness of confocal microscopy -- Confocal laser scanning microscopic particle imaging velocimetry (CLSM-PIV) system -- Near-field applications of CLSM-PIV -- Poiseuille flows in a microtube -- Microscale rotating Couette flows -- Moving bubbles in a microchannel -- Surface Plasmon Resonance Microscopy (SPRM) -- Surface plasmon polaritons (SPPs) -- Dispersion of SPP -- Kretschmann's three-layer configuration -- Surface plasmon resonance (SPR) reflectance -- Surface plasmon resonance microscopy (SPRM) imaging systems -- Selection of a prism for SPRM -- SPR reflectance imaging resolution -- Near-field applications of SPRM -- History and uses of SPRM -- Label-free mapping of microfluidic mixing fields -- Near-field mapping of salinity diffusion -- Dynamic monitoring of nanoparticle concentration profiles -- Unveiling the fingerprints of nanocrystalline self-assembly -- Near-wall thermometry -- Reflection Interference Contrast Microscopy (RICM) -- Interference of plane waves -- Principles and practical issues of RICM -- Near-field applications of RICM -- Thin-film thickness measurements -- Electrohydrodynamic (EHD) control of thin liquid film -- Dynamic fingerprinting of live-cell focal contacts -- References.
520			_aThe near-field the region within 100 nm from a solid interface - is an exciting arena in which several important multi-scale transport phenomena are physically characterized, such as flow mixing and drag, heat and mass transfer, near-wall behavior of nanoparticles, the binding of bio-molecules, crystallization, and surface deposition processes, just to name a few. This book presents a number of microscopicimaging techniques that were implemented and tested for near-field fluidic characterizations. These methods include Total Internal Reflection Microscopy (TIRM), Optical Serial Sectioning Microscopy (OSSM), Confocal Laser Scanning Microscopy (CLSM), Surface Plasmon Resonance Microscopy (SPRM), and Reflection Interference Contrast Microscopy (RICM). The basic principles, specifics of implementation, and example applications of each method are presented in order to promote the reader's understanding of the techniques, so that these may be applied to their own research interests.
650			_aEngineering. _996
650			_aEngineering. _996
650			_934088 _aHYDRAULIC ENGINEERING
650			_933943 _aENGINEERING FLUID DYNAMICS
650			_933706 _aFLUID, AND AERODYNAMICS
710			_aSpringerLink (Online service) _9111
856			_uhttp://springer.escuelaing.metaproxy.org/book/10.1007/978-3-642-20426-5 _yir a documento _qURL
942			_2ddc _cCF
999			_c14265 _d14265